Coordinator : Dr.  Aurangzeb Khan

Scanning Electron Microscope (SEM) for microstructural analysis of diamond films.
X. Yin is loading a sample in the X-ray diffactometer for the indentification of crystallographic properties of materials.

For basic education and principle understanding of Scanning Electron Microscopy, please, use following web resources:
 

http://www.mse.iastate.edu/microscopy/choice.html
http://www.unl.edu/CMRAcfem/em.htm
http://www.unl.edu/CMRAcfem/semoptic.htm
http://charfacnu.cie.umn.edu/glossary/FrameGloss.html
http://www.jeol.com/sem_gde/tbcontd.html
http://www.sem.com/analytic/sem.htm
http://www.ou.edu/research/electron/www-vl/long.shtml#referenc
http://acept.la.asu.edu/PiN/rdg/elmicr/elmicr.shtml
http://www.jeoleuro.com/learn/semdictionary/semdictionary.htm
http://www.geocities.com/CapeCanaveral/Lab/1987/zfundam.html

For more information on the Electron Beam Induced Current Technique, please, refer to:
 

http://www.hut.fi/Units/Electron/Research/res2000/Ebic/EBIC.html
http://www.techfak.uni-kiel.de/matwis/amat/def_en/kap_6/illustr/i6_1_7.html
http://www.analyticalsol.com/ebicvlt1.htm
http://www.dur.ac.uk/~dph0www5/sem.html
http://www.rontec.com/en/5/4/2